rus
Issue #1/2021
N. N. Gerasimenko
Boron Analysis in Glass Powder Using Wavelength Dispersive X-ray Fluorescence Spectrometer
Boron Analysis in Glass Powder Using Wavelength Dispersive X-ray Fluorescence Spectrometer
DOI: 10.22184/2227-572X.2021.11.1.46.48
The results of the quantitative determination of boron oxide content in glass by the XRF method on a ZSX Primus IV spectrometer using a 4 kW X-ray tube and a modern synthetic multilayer crystal analyzer RX85 are presented. An experimental check of the automatic pressure control system for maintaining a stable vacuum in the measuring chamber has been carried out. The influence of this parameter on the stability of the results obtained is shown. Repeatability tests have confirmed the quality of the results obtained.
The results of the quantitative determination of boron oxide content in glass by the XRF method on a ZSX Primus IV spectrometer using a 4 kW X-ray tube and a modern synthetic multilayer crystal analyzer RX85 are presented. An experimental check of the automatic pressure control system for maintaining a stable vacuum in the measuring chamber has been carried out. The influence of this parameter on the stability of the results obtained is shown. Repeatability tests have confirmed the quality of the results obtained.
Теги: auto pressure control (apc) boron glass powder pressed powder method synthetic multilayer analyzer rx85 бор метод прессованных порошков синтетический многослойный кристалл-анализатор rx85 система автоматического контроля давления арс стекольный порошок
Boron Analysis in Glass Powder Using Wavelength Dispersive X-ray Fluorescence Spectrometer
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